Arthur’s main interests lie in large-signal characterization and substrate engineering, with a focus on silicon and InP/InPoSi substrates for the European project Move2THz.

His work involves comprehensive large-signal modeling to analyze the nonlinear behavior of semiconductor substrate interfaces, particularly assessing substrate-induced harmonic distortion in passive devices.

Additionally, he is engaged in characterizing and optimizing substrate technologies to enable efficient integration of RF and mm-wave devices. His research supports the development of next-generation high-frequency systems leveraging silicon and InP-based technologies.