News Description
( current | all | 2024 | 2023 | 2022 | 2021 | 2020 | 2019 | 2018 | 2017 | 2016 | 2015 | 2014 | 2013 | 2012 | 2011 | 2010 | 2009 | 2008 | 2007 | 2006)It’s our pleasure to announce
The Second Edition of the Winfab Scientific Day
to be held in Louvain-la-Neuve (UCL), Aud. Sciences 01, on Friday 17 October 2014.
During this scientific event, organized by the Micro- and Nano-Fabrication Platform of the Université catholique de Louvain (Winfab), you will have the opportunity to attend several presentations focused on Micro- and Nano-Technologies, including:
Two invited lectures by internationally recognized researchers:
o Measuring Fatigue Properties of Micro-and Nano-Scale Objects,
by Prof. O. Pierron (Georgia Tech University, USA)
o InAs and InSb Nanowires for High Frequency and Ballistic Devices,
by Dr. R. Leturcq (CRP Gabriel Lippmann, Luxembourg)
Two presentations on Micro- and Nano-Fabrication Techniques:
o The Focus Ion Beam (FIB) technique, by Dr. E. Lamers (Carl Zeiss s.a.)
o The Atomic Layer Deposition (ALD) technique, by Prof. L. Francis (UCL).
Several oral contributions by researchers working in the Winfab platform.
The complete program of the Second Winfab Scientific Day is to be found on http://www.uclouvain.be/en-445970.html
The participation to the Winfab Scientific Day is free of charge but online registration at the following address is required: http://www.uclouvain.be/en-445965.html
All participants are welcome to contribute to the Winfab Scientific Day in the form of posters. If you want to present a poster, please, prepare an abstract using the template attached to this e-mail, and submit it by e-mail to sebastien.faniel@uclouvain.be
Deadline for abstract submission is September 19th 2014
Deadline for online registration is October 10th 2014
Please, feel free to forward this invitation to all your colleagues/collaborators who may be interested in attending the Winfab Scientific Day.
Hoping to see many of you at this event.
Best regards,
Sébastien Faniel
(for the organizing committee)