Aims
Critical initiation of the students to the new physics based analysis methods for solid surface and interface characterization at the atomic scale.
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Main themes
- Introduction to Surface Science
- Electron spectrometries: LEED, AES, XPS
- Ion spectrometries: ISS, RBS, SIMS
- Ion sputtering for depth profiling
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Other credits in programs
MATR22
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Deuxième année du programme conduisant au grade d'ingénieur civil en science des matériaux
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(4 credits)
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