Aims

Understanding of fundamental phenomena related to the techniques used in materials characterization

Main themes

1 Introduction
Physical characterization methods: classification, application fields
2 Radiation- matter interaction
- Radiation types: photons, electrons, ions
- Absorption, stopping power, range
- Reflection, scattering (elastic and inelastic)
- Refraction, diffraction
- Secondary emission
3 Basic principles of the different spectroscopies and chemical composition analysis
Atomic absorption and emission, electron spectroscopies, X-ray fluorescence, vibration spectroscopies, mass spectrometries, ion backscattering spectrometries and resonance methods
4 Basic principles of the different microscopies and morphology analysis
Optic, electron and near field microscopies
5 Diffraction techniques and structure analysis
Light, RX, electron and neutron diffractions
6 Application to materials characterization
Case studies (labs and exercises)

Other credits in programs