Title: "Light Field Methods for the Visual Inspection of Transparent Objects"
Speaker: (invited talk) Johannes Meyer (KIT, Karlsruhe, Germany)
Location: "Shannon" Seminar Room, Place du Levant 3, Maxwell Building, 1st floor
Date / Time (duration): Tuesday 24/10/2017, 14h00 (~45')
Abstract: Components made of transparent materials play an important role in humanís every-day life. For example, they are employed to build windshields for automobiles and aircrafts or to guide light beams in high-precision optical systems and therefore have to meet high quality requirements. However, powerful automated visual inspection systems for transparent materials are still an open research question.
This talk presents several novel approaches for inspecting transparent objects based on the concepts of light fields. In several experiments we could show, that the lightís propagation direction, which is contained in light fields, conveys much useful information for imaging material defects in transparent objects. The introduced methods cover all three main components of a typical visual inspection system: illumination (using inverse light fields), acquisition (of deflection maps using a laser light field scanner) and processing (of deflection maps using a gradient-based approach).
Biography: In 2012 Johannes Meyer received his B.Sc. and in 2014 his M.Sc. in computer science from the Karlsruhe Institute of Technology (KIT) in Germany. Since then he is a research associate at the Vision and Fusion Laboratory (IES) at the KIT and works towards his PhD. His research mainly focuses the automated visual inspection of transparent objects. Johannes Meyer works in close cooperation to the Fraunhofer Institute of Optronics, System Technologies and Image Exploitation (IOSB) in Karlsruhe.
You can also find an interview of Johannes Meyer here <
Last updated October 26, 2017, at 12:30 PM