5 credits
30.0 h + 15.0 h
Q2
Teacher(s)
Delcorte Arnaud; Nysten Bernard;
Language
English
Main themes
- Introduction to Surface Science;
- Electron spectrometries (LEED, AES, XPS) and Ion spectrometries (ISS, RBS, SIMS) ;
- Near field microscopies (STM, AFM).
Aims
At the end of this learning unit, the student is able to : | |
1 | Contribution of the course to the program objectives LO : 1.1, 2.1, 2.3, 5.5 Specific learning outcomes of the course a. Disciplinary Learning Outcomes: Electron and ionic spectroscopies: At the end of the course, the student will be able to
Scanning probe microscopies (SPM): At the end of the course, the student will be able to
b. Transversal Learning Outcomes: At the end of the course, the student will be able to:
|
The contribution of this Teaching Unit to the development and command of the skills and learning outcomes of the programme(s) can be accessed at the end of this sheet, in the section entitled “Programmes/courses offering this Teaching Unit”.
Content
1. Introduction ro surface science
2. Electronic and ionic spectroscopies
2.1. Electron diffraction (LEED/RHEED)
2.2. X-ray photoelectron spectroscopy (XPS/ESCA)
2.3. Auger electron spectroscopy/microscopy (AES/SAM)
2.4. Ion scattering spectroscopy (ISS)
2.5. Secondary ion mass spectrometry (SIMS)
3. Scanning probe microscopies
3.1. Scanning tunnelling microscopy and spectroscopy
3.2. Atomic force microscopies
3.2.1. Contact mode microscopies : C-AFM, LFM, FMM, CS-AFM, PFM, ...
3.2.2. Resonant mode microscopies : AM-AFM, FM-AFM, MFM, EFM, KPFM, ...
3.2.3. Instrumental aspects : scanner, probes, artifacts, ...
2. Electronic and ionic spectroscopies
2.1. Electron diffraction (LEED/RHEED)
2.2. X-ray photoelectron spectroscopy (XPS/ESCA)
2.3. Auger electron spectroscopy/microscopy (AES/SAM)
2.4. Ion scattering spectroscopy (ISS)
2.5. Secondary ion mass spectrometry (SIMS)
3. Scanning probe microscopies
3.1. Scanning tunnelling microscopy and spectroscopy
3.2. Atomic force microscopies
3.2.1. Contact mode microscopies : C-AFM, LFM, FMM, CS-AFM, PFM, ...
3.2.2. Resonant mode microscopies : AM-AFM, FM-AFM, MFM, EFM, KPFM, ...
3.2.3. Instrumental aspects : scanner, probes, artifacts, ...
Teaching methods
Electron and ionic spectroscopies:
9 lectures of 2h each (including a 1 hour general introduction on surface science) and 2 laboratories illustrating selected techniques (instrumental aspects + data interpretation; reports asked to the students).
Scanning probe microscopies (SPM):
5 lectures of 2h each and 2 laboratories illustrating two SPM techniques. For the laboratories, students of 2nd Master are encouraged to bring their own samples.
9 lectures of 2h each (including a 1 hour general introduction on surface science) and 2 laboratories illustrating selected techniques (instrumental aspects + data interpretation; reports asked to the students).
Scanning probe microscopies (SPM):
5 lectures of 2h each and 2 laboratories illustrating two SPM techniques. For the laboratories, students of 2nd Master are encouraged to bring their own samples.
Evaluation methods
Oral examination regarding the competencies that have to be acquired
Other information
It is highly recommended to have attended the LMAPR2011 « Methods of Physical and Chemical Analysis » course or an equivalent.
Online resources
Bibliography
Spectroscopies électroniques et ioniques :
- Dias présentées aux cours, disponibles sur Moodle
- Notes d'application des fabricants d'équipement
- Liste d'ouvrages de référence, que les étudiants peuvent trouver à la bibliothèque / au laboratoire
- Notes de cours évolutives (syllabus) disponible au SICI et sur Moodle
- Dias présentées aux cours, prospectus et notes d'application de fabricants d'équipement disponibles sur Moodle
Faculty or entity
FYKI