- \n
- Wideband device model extraction [DL05b<\/a>, DL07<\/a>, VK07<\/a>, LN21b<\/a>, VK21<\/a>, AM21<\/a>].<\/li>\n
- Separation of intrincis anc extrinsic device parameters.<\/li>\n<\/ul>\n
Thermal Parameters<\/em><\/strong><\/h5>\n
Thermal resistance and capacitance.<\/p>\n
Static and dynamic self-heating.<\/p>\n
Electrical characterization techniques and effects to account for.<\/p>\n
- \n
- Device self-heating extractions [SM13<\/a>, SM16<\/a>, LN21h<\/a>].<\/li>\n<\/ul>\n
Extreme Conditions<\/em><\/strong><\/h5>\n
- \n
- Sub-THz substrate characterization [LN19<\/a>].<\/li>\n
- High-Temperature device performance [AHT22]<\/a>, [AHT23]<\/a><\/li>\n
- Cryogenic device behavior, extraction and modelling [BKE19]<\/a>, [LN19c]<\/a>, [LN20c]<\/a>.<\/li>\n<\/ul>\n
\u00a0
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<\/p>\n","protected":false},"excerpt":{"rendered":"Devices UCLouvain’s RF-SOI team has over 30 years of experience in characterizing, extracting and modelling semiconductor transistor devices. Our expertise include small-signal modelling, extraction of intrinsic device parameters as well as extrinsic parasitics (BEOL parasitics, substrate network, etc.), large-signal behavior, device self-heating, RF and mm-wave FoMs, high-temperature and cryogenic models, and more. Device Characterization and […]<\/p>\n","protected":false},"author":13,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"site-sidebar-layout":"no-sidebar","site-content-layout":"page-builder","ast-site-content-layout":"full-width-container","site-content-style":"default","site-sidebar-style":"default","ast-global-header-display":"","ast-banner-title-visibility":"","ast-main-header-display":"","ast-hfb-above-header-display":"","ast-hfb-below-header-display":"","ast-hfb-mobile-header-display":"","site-post-title":"disabled","ast-breadcrumbs-content":"","ast-featured-img":"disabled","footer-sml-layout":"","ast-disable-related-posts":"","theme-transparent-header-meta":"","adv-header-id-meta":"","stick-header-meta":"","header-above-stick-meta":"","header-main-stick-meta":"","header-below-stick-meta":"","astra-migrate-meta-layouts":"set","ast-page-background-enabled":"default","ast-page-background-meta":{"desktop":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"tablet":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"mobile":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""}},"ast-content-background-meta":{"desktop":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"tablet":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"mobile":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""}},"footnotes":""},"class_list":["post-25123","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/sites.uclouvain.be\/RF-SOI-group\/wp-json\/wp\/v2\/pages\/25123","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/sites.uclouvain.be\/RF-SOI-group\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/sites.uclouvain.be\/RF-SOI-group\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/sites.uclouvain.be\/RF-SOI-group\/wp-json\/wp\/v2\/users\/13"}],"replies":[{"embeddable":true,"href":"https:\/\/sites.uclouvain.be\/RF-SOI-group\/wp-json\/wp\/v2\/comments?post=25123"}],"version-history":[{"count":32,"href":"https:\/\/sites.uclouvain.be\/RF-SOI-group\/wp-json\/wp\/v2\/pages\/25123\/revisions"}],"predecessor-version":[{"id":26373,"href":"https:\/\/sites.uclouvain.be\/RF-SOI-group\/wp-json\/wp\/v2\/pages\/25123\/revisions\/26373"}],"wp:attachment":[{"href":"https:\/\/sites.uclouvain.be\/RF-SOI-group\/wp-json\/wp\/v2\/media?parent=25123"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}
- High-Temperature device performance [AHT22]<\/a>, [AHT23]<\/a><\/li>\n
- Sub-THz substrate characterization [LN19<\/a>].<\/li>\n
- Separation of intrincis anc extrinsic device parameters.<\/li>\n<\/ul>\n